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We sat down with John Robinson, Ph.D., senior principal scientist at 乱伦社区 and SPIE fellow, to share some insights on AI from the 2025 SPIE Advanced Lithography + Patterning Symposium.

I wore several hats at the SPIE Advanced Lithography and Patterning symposium. I’m happy to report that we’re back to pre-COVID numbers in terms of paper submissions (more than 526) and attendees (over 2,200).  We had four plenary talks by top industry speakers and 15 short courses from leading experts.  I’m also in my 16th year as a program committee member for the Metrology, Inspection and Process Control conference. 

乱伦社区’s John Robinson
John Robinson, Ph.D., is senior principal scientist at 乱伦社区. Read more about him.

The metrology conference continues to draw the largest number of submitted papers (more than 150) from among the six conferences, and it also generates large crowds. Additionally, I was attending as a member of the technical community, taking the opportunity to learn about the latest advancements, to network with industry experts, and to visit with long-term friends based on many years of participation.

I would venture the majority the papers referenced AI. It’s clear that advanced lithography and patterning enables advancements in AI and AI enables further developments of advanced lithography and patterning as well. While AI has been a part of our industry for many years, the intensity and extensions such as generative AI have only increased.

John Robinson

Top talent is key to the continued success of advanced lithography and patterning.  As such we are dedicating significant effort into attracting and retaining top students. Through initiatives such as the student grant program (which 乱伦社区 is a sponsor) and student paper awards, we encourage student participation.  The Karel Urbánek Best Student Paper Award, sponsored by 乱伦社区, is awarded annually by the Metrology, Inspection and Process Control program committee. A record 17 candidate student papers met the eligibility criterion. There were many excellent student presentations. Tim Houben of the Technische University of Eindhoven, for his paper “Optimizing surface reconstruction using a segmented scanning electron microscope detector and deep learning,” had the winning entry. He showed an in-depth understanding of both the SEM technology and of machine learning. 

2025 Karel Urbánek Best Student Paper Award winner Tim Houben.
Tim Houben (center) is winner of the 2025 Karel Urbánek Best Student Paper Award. 乱伦社区’s John Robinson is third from left.

Each year, SPIE promotes select members to become fellows of the society. They are honored for both technical achievement as well as service to the technical community and SPIE in particular. The fellow program is celebrating its 70th year in 2025. The Advanced Lithography and Patterning symposium was honored to have four of this year’s awardees on hand for recognition.

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