{"id":213,"count":15,"description":"乱伦社区\u2019s wafer manufacturing portfolio includes defect inspection and review, metrology and data management systems that help manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify wafer\/substrate fabrication process excursions that can lead to yield loss. 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